1. Abstraction refinement for large scale model checking.

by Wang, Chao | Hachtel, Gary D | Somenzi, Fabio.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: New York: Springer, 2006Availability: Items available for loan: [Call number: 004.21 WAN] (1).
2. Leakage in nanometer CMOS technologies

by Chandrakasan, Anantha P | Narendra, Siva G.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: New York: Springer, 2006Availability: Items available for loan: [Call number: 621.38412 NAR] (1).
3. Routing congestion in VLSI circuits : estimation and optimization

by Saxena, Prashant | Sapatnekar, Sachin S | Shelar, Rupesh S.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: New York: Springer, 2007Availability: Items available for loan: [Call number: 621.395 SAX] (1).
4. Low power design essentials

by Rabaey, Jan M.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: New York: Springer, 2009Availability: Items available for loan: [Call number: 621.3815 RAB] (1). Checked out (1).
5. Secure integrated circuits and systems

by Verbauwhede, Ingrid.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: New York: Springer, 2010Availability: Items available for loan: [Call number: 621.3815 VER] (1).
6. Embedded memories for nano-scale VLSIs

by Zhang, Kevin.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: New York: Springer, 2009Availability: Items available for loan: [Call number: 621.395 ZHA] (1).
7. Design for manufacturability and yield for nano-scale CMOS

by Kawa, Jamil | Chiang, Charles C.

Material type: book Book; Format: print ; Literary form: Not fiction Publisher: Dordrecht: Springer, 2007Availability: Items available for loan: [Call number: 621.38412 CHI] (1).

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